(1) Abnormality detection
Capable of detecting abnormal resolver signals, breaking of resolver signals, abnormal R/D conversion and abnormally high temperature of a IC
(2) Built in self-test
Conducts a self-test on R/D conversion and abnormality detection
(1) Integrated with an excitation amplifier (Output current: 1 OmA rms/20mA rms)
(2) Integrated with an operation clock
(1) Requires no phase adjustment to excitation signals (Allowable range: Within土45゜
(2) Variable setting of controlling bandwidth (fBW) (Selectable from 7 types of fixed values or automatic adjustment)
(3) Capable of digital conversion of linear hall IC signals and R/D parallel connections to resolvers
(4) Output redundancy (Triple redundancy-Parallel/Pulse/Serial output)